特集：放射能の除染にかかわる表面科学
X線光電子分光分析によるセシウム化合物の化学シフト
2013 年 34 巻 3 号 p. 131-134
詳細
2013 年 34 巻 3 号 p. 131-134
The chemical shift of the 3d5/2 line of several cesium compounds were measured under the same condition by X-ray photoelectron spectroscopy. With the Auger line (M4N45N45) , the figure of chemical state plot (Wager plot) of the cesium compounds was drawn. When many materials are developed for decontamination of radioactive substances, and the new materials will be evaluated for the future, the measured data are used for the confirmation of the binding state.
