表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:イオン液体研究の発展と表面・界面への展開
全反射XAFS 法によるイオン液体対イオンの水溶液表面での溶媒和構造に関する研究
今井 洋輔李 慧慧瀧上 隆智松原 弘樹荒殿 誠
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2013 年 34 巻 4 号 p. 179-184

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The total reflection X-ray absorption fine structure (TR-XAFS) technique was applied to adsorbed films at the surface of aqueous solutions of 1-decyl-3-methylimidazolium bromide (DeMIMBr), 1-hexyl-3-methylimidazolium bromide (HMIMBr) and 1-hexyl-3-methylimidazolium tetrafluoroborate (HMIMBF4) mixture, and dodecyltrimethylammonium bromide (DTABr) and dodecyltrimethylammonium tetrafluoroborate (DTABF4) mixtures. The obtained χ spectra were expressed as linear combinations of two specific spectra corresponding to fully hydrated bromide ions (free-Br) and partially dehydrated bromide ions adsorbed to the hydrophilic groups of surfactant ions (bound-Br) at the surface. The proportions of free-and bound-Br ions were evaluated as a function of surface tension and surface composition of the surfactants. The relation between counterion distribution and miscibility of counterions at the solution surface was discussed and the importance of hydrogen bond formation between surfactant cation and counter anion was stressed.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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