XAFS (X-ray absorption Fine Structure) was available in the advents of synchrotron radiation (SR) and short range order theory. In 1982, Photon Factory starts in Japan and since then XAFS has been our daily tool for surface analysis. The Frontier of surface science is nanoscience and nanotechnology. XAFS has been developed to be an appropriate technique for the investigation of nanomaterials which require the applicability of XAFS to light, thin, short and small targets. We review the recent development in XAFS in these key words “light, thin, short and small”. We also discuss the future of XAFS in stand point of new light sources, XFEL and ERL. However both of them are a bit different from SR but complementary ones. These new light sources will make it possible to open a new horizon in XAFS in surface science.