表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:X線吸収分光法の最前線
DXAFSによる時間分解X線吸収分光
片山 真祥稲田 康宏
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2014 年 35 巻 3 号 p. 141-145

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Dispersive XAFS is applicable to the millisecond time-resolved sequential measurement. DXAFS apparatus consists of a bent crystal (polychromator) and a position sensitive detector. There is no mechanical movement during the measurement. The time resolution of DXAFS is suitable to analyze chemical reactions started by introducing a reactant. XAFS spectrum of short-lived reaction intermediate can be obtained from DXAFS experiment. The formation of intermediate CoO species has been confirmed during the oxidation process of supported Co catalyst to Co3O4. Reaction kinetics is also an important information obtained from the time change of X-ray absorbance. The reaction mechanism of H2 reduction process of supported metal oxide catalysts was analyzed by the DXAFS technique. It is clarified that the oxygen migration process is a key step in the reduction of supported metal oxides.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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