特集：X線吸収分光法の最前線
マイクロXAFS法と鉄さび層断面の局所構造解析への応用
2014 年 35 巻 3 号 p. 146-151
詳細
2014 年 35 巻 3 号 p. 146-151
XAFS measurements with the spatial resolution are attractive in the analytical applications of synchrotron X-ray microprobe. The present status of the X-ray focusing elements such as zone plate and aspherical total reflection mirror is explained and the analytical systems for micro XAFS measurements are reviewed. Micro XAFS measurements were applied to the Cr concentrated rust layer of weathered steel, and the local structural changes of iron in the Cr enriched region were observed.
