Esaki diodes live and learn

Leo ESAKI; Masatoshi KITAMURA; Satoshi IWAMOTO; Yasuhiko ARAKAWA

doi:10.2183/pjab.86.451

Proceedings of the Japan Academy, Series B

Online ISSN : 1349-2896
Print ISSN : 0386-2208
ISSN-L : 0386-2208

Original Paper

Esaki diodes live and learn

Leo ESAKI, Masatoshi KITAMURA, Satoshi IWAMOTO, Yasuhiko ARAKAWA

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Keywords: electron tunneling, semiconductors, shelf life tests

JOURNAL FREE ACCESS

2010 Volume 86 Issue 4 Pages 451-453

DOI https://doi.org/10.2183/pjab.86.451

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Abstract

We report, as the result of shelf-life tests for Esaki diodes, the observation of minute but tangible reductions in the tunnel current after the lapse of half a century. The reduction could be attributed to 0.25% widening in the tunnel path.

(Contributed by Leo ESAKI, M.J.A.)

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