2014 Volume 122 Issue 1421 Pages 25-28
Phosphorus doped WO3 (PxW1−xO3) ceramics were fabricated by a solid state reaction. Temperature and frequency dependence of dielectric properties for the PxW1−xO3 (x = 0–0.15) ceramics were evaluated at the temperature between −20 to 80°C. The dielectric constant of the P0.05W0.95O3 ceramic was 3600–5800 at the frequency range from 1 kHz to 1 MHz in the room temperature, and the dielectric loss of the P0.05W0.95O3 ceramic were less than 0.1 at the frequency of higher than 160 kHz. The dielectric anomaly peak of the WO3 ceramic has been observed at 20°C, and the dielectric anomaly peak of the P0.05W0.95O3 ceramic has been observed at about 0°C. The interaction between temperature dependence of dielectric properties (dielectric anomaly) ceramics and structural change of the WO3 and P0.05W0.95O3 were evaluated by Raman spectra.